Rapid estimation of porosity and mineral abundance in backscattered electron images using a simple SEM image analyser
By: Pye, K
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Material type: 
ArticleDescription: 81 - 84 pp ; Illustration.Subject(s): SEM image analyser | Electron microscopy | Sedimentary petrology - techniques and instrumentation | Petrology
In:
Geological magazine : Vol. 121 Iss. 1-6 Year. 1984Summary: Image analysis is rapidly becoming an integral part of scanning electron microscopy. A number of analogue and digital image analysis systems of varying sophistication are now commercially available for the SEM. This paper illustrates how one such relatively simple system, the IMAS image analyser manufactured by Cambridge Technology, can be used to obtain rapid quantitative estimates of porosity and mineral abundance in backscattered electron images of polished rock sections.
| Item type | Current location | Collection | Call number | Status | Date due | Barcode |
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Article
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Library and Information Centre Periodical Section | Bound Journal Collection | Not for loan | 002532_11 | ||
Serials/Scientific Journal
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Library and Information Centre Periodical Section | Bound Journal Collection | 550 GEO (Browse shelf) | Available | 002532 |
Image analysis is rapidly becoming an integral part of scanning electron microscopy. A number of analogue and digital image analysis systems of varying sophistication are now commercially available for the SEM. This paper illustrates how one such relatively simple system, the IMAS image analyser manufactured by Cambridge Technology, can be used to obtain rapid quantitative estimates of porosity and mineral abundance in backscattered electron images of polished rock sections.
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