Advanced scanning electron microscopy and x-ray microanalysis
By: S.J.B.R.
Material type: ArticleDescription: 709PP.Subject(s): X-ray microanalysis | Scanning electron microscopy | Pathology | Physics In: Geological magazine : Vol. 123 Iss. 1-6 Year. 1986Item type | Current location | Collection | Call number | Status | Date due | Barcode |
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Article | Library and Information Centre Periodical Section | Bound Journal Collection | Not for loan | 002533_153 | ||
Serials/Scientific Journal | Library and Information Centre Periodical Section | Bound Journal Collection | 550 GEO (Browse shelf) | Available | 002533 |
This is an Book reviews of Advanced scanning electron microscopy and x-ray microanalysis. By D. E. Newbury, D. C. Joy, P. Echlin, C. E. Fiori and J. I. Goldstein. Pp. xii + 45, London, Plenum Press,1986. ISBN 0306421402
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